Denna sida på svenska This page in English

Scanning Probe Microscopy


7.5 credits, Advanced (Second Cycle)

The course deals with both theoretical and practical aspects of handling and possible applications of scanning probe microscopy. Scanning probe methods are used in a wide range of research areas, such as advanced physics, chemistry at the atomic level and applications in biology, studying single cells and viruses. The techniques of scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are given particular attention.

Course code: FYST42/FAFN30/NAFY004

Course plan:

Next occasion: lp4

Course responsibles: Jan Knudsen, Rainer Timm